学术探索
学术期刊
新闻热点
数据分析
智能评审
立即登录
AU-MG IMPROVED OHMIC CONTACTS TO P-GAAS
被引:5
作者
:
PAPANICOLAOU, NA
论文数:
0
引用数:
0
h-index:
0
机构:
USN,RES LAB,WASHINGTON,DC 20375
USN,RES LAB,WASHINGTON,DC 20375
PAPANICOLAOU, NA
[
1
]
CHRISTOU, A
论文数:
0
引用数:
0
h-index:
0
机构:
USN,RES LAB,WASHINGTON,DC 20375
USN,RES LAB,WASHINGTON,DC 20375
CHRISTOU, A
[
1
]
机构
:
[1]
USN,RES LAB,WASHINGTON,DC 20375
来源
:
ELECTRONICS LETTERS
|
1983年
/ 19卷
/ 11期
关键词
:
D O I
:
10.1049/el:19830287
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
引用
收藏
页码:418 / 420
页数:3
相关论文
共 7 条
[1]
OHMIC CONTACTS FOR GAAS DEVICES
COX, RH
论文数:
0
引用数:
0
h-index:
0
COX, RH
STRACK, H
论文数:
0
引用数:
0
h-index:
0
STRACK, H
[J].
SOLID-STATE ELECTRONICS,
1967,
10
(12)
: 1213
-
+
[2]
OHMIC CONTACTS TO EPITAXIAL PGAAS
GOPEN, HJ
论文数:
0
引用数:
0
h-index:
0
GOPEN, HJ
YU, AYC
论文数:
0
引用数:
0
h-index:
0
YU, AYC
[J].
SOLID-STATE ELECTRONICS,
1971,
14
(06)
: 515
-
&
[3]
HOLLAND L, 1958, VACUUM DEPOSITION TH, P541
[4]
BACK SURFACE GETTERING AND CR OUT-DIFFUSION IN VPE GAAS-LAYERS
MAGEE, TJ
论文数:
0
引用数:
0
h-index:
0
机构:
CHARLES EVANS & ASSOC,SAN MATEO,CA 94402
MAGEE, TJ
PENG, J
论文数:
0
引用数:
0
h-index:
0
机构:
CHARLES EVANS & ASSOC,SAN MATEO,CA 94402
PENG, J
HONG, JD
论文数:
0
引用数:
0
h-index:
0
机构:
CHARLES EVANS & ASSOC,SAN MATEO,CA 94402
HONG, JD
EVANS, CA
论文数:
0
引用数:
0
h-index:
0
机构:
CHARLES EVANS & ASSOC,SAN MATEO,CA 94402
EVANS, CA
DELINE, VR
论文数:
0
引用数:
0
h-index:
0
机构:
CHARLES EVANS & ASSOC,SAN MATEO,CA 94402
DELINE, VR
MALBON, RM
论文数:
0
引用数:
0
h-index:
0
机构:
CHARLES EVANS & ASSOC,SAN MATEO,CA 94402
MALBON, RM
[J].
APPLIED PHYSICS LETTERS,
1979,
35
(03)
: 277
-
279
[5]
POALA CR, 1970, SOLID STATE ELECTRON, V13, P1189
[6]
METALLURGICAL AND ELECTRICAL PROPERTIES OF ALLOYED NI-AU-GE FILMS ON N-TYPE GAAS
ROBINSON, GY
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV MINNESOTA,ELECT ENGN DEPT,MINNEAPOLIS,MN 55455
UNIV MINNESOTA,ELECT ENGN DEPT,MINNEAPOLIS,MN 55455
ROBINSON, GY
[J].
SOLID-STATE ELECTRONICS,
1975,
18
(04)
: 331
-
&
[7]
SINTERED OHMIC CONTACTS TO N-TYPE AND P-TYPE GAAS
SINHA, AK
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
SINHA, AK
SMITH, TE
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
SMITH, TE
LEVINSTEIN, HJ
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
LEVINSTEIN, HJ
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1975,
ED22
(05)
: 218
-
224
←
1
→
共 7 条
[1]
OHMIC CONTACTS FOR GAAS DEVICES
COX, RH
论文数:
0
引用数:
0
h-index:
0
COX, RH
STRACK, H
论文数:
0
引用数:
0
h-index:
0
STRACK, H
[J].
SOLID-STATE ELECTRONICS,
1967,
10
(12)
: 1213
-
+
[2]
OHMIC CONTACTS TO EPITAXIAL PGAAS
GOPEN, HJ
论文数:
0
引用数:
0
h-index:
0
GOPEN, HJ
YU, AYC
论文数:
0
引用数:
0
h-index:
0
YU, AYC
[J].
SOLID-STATE ELECTRONICS,
1971,
14
(06)
: 515
-
&
[3]
HOLLAND L, 1958, VACUUM DEPOSITION TH, P541
[4]
BACK SURFACE GETTERING AND CR OUT-DIFFUSION IN VPE GAAS-LAYERS
MAGEE, TJ
论文数:
0
引用数:
0
h-index:
0
机构:
CHARLES EVANS & ASSOC,SAN MATEO,CA 94402
MAGEE, TJ
PENG, J
论文数:
0
引用数:
0
h-index:
0
机构:
CHARLES EVANS & ASSOC,SAN MATEO,CA 94402
PENG, J
HONG, JD
论文数:
0
引用数:
0
h-index:
0
机构:
CHARLES EVANS & ASSOC,SAN MATEO,CA 94402
HONG, JD
EVANS, CA
论文数:
0
引用数:
0
h-index:
0
机构:
CHARLES EVANS & ASSOC,SAN MATEO,CA 94402
EVANS, CA
DELINE, VR
论文数:
0
引用数:
0
h-index:
0
机构:
CHARLES EVANS & ASSOC,SAN MATEO,CA 94402
DELINE, VR
MALBON, RM
论文数:
0
引用数:
0
h-index:
0
机构:
CHARLES EVANS & ASSOC,SAN MATEO,CA 94402
MALBON, RM
[J].
APPLIED PHYSICS LETTERS,
1979,
35
(03)
: 277
-
279
[5]
POALA CR, 1970, SOLID STATE ELECTRON, V13, P1189
[6]
METALLURGICAL AND ELECTRICAL PROPERTIES OF ALLOYED NI-AU-GE FILMS ON N-TYPE GAAS
ROBINSON, GY
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV MINNESOTA,ELECT ENGN DEPT,MINNEAPOLIS,MN 55455
UNIV MINNESOTA,ELECT ENGN DEPT,MINNEAPOLIS,MN 55455
ROBINSON, GY
[J].
SOLID-STATE ELECTRONICS,
1975,
18
(04)
: 331
-
&
[7]
SINTERED OHMIC CONTACTS TO N-TYPE AND P-TYPE GAAS
SINHA, AK
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
SINHA, AK
SMITH, TE
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
SMITH, TE
LEVINSTEIN, HJ
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC,MURRAY HILL,NJ 07974
BELL TEL LABS INC,MURRAY HILL,NJ 07974
LEVINSTEIN, HJ
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1975,
ED22
(05)
: 218
-
224
←
1
→