SILICON POWDER DIFFRACTION STANDARD REFERENCE MATERIAL

被引：172

作者：

HUBBARD, CR ^{[1
]}

SWANSON, HE ^{[1
]}

MAUER, FA ^{[1
]}

机构：

[1] NBS, INST MAT RES, WASHINGTON, DC 20234 USA

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 1975年 / 8卷 / FEB1期

关键词：

D O I：

10.1107/S0021889875009508

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

引用

页码：45 / 48

页数：4

共 20 条

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[4] X-RAY TO VISIBLE WAVELENGTH RATIOS [J].

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[5]

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[6]

GRAY DE, 1972, AM I PHYSICS HDB, P3

[7]

HUBBARD CR, TO BE PUBLISHED

[8] MEASUREMENT OF LATTICE PARAMETER OF SILICON USING A DOUBLE-DIFFRACTION EFFECT [J].

ISHERWOOD, BJ ;

WALLACE, CA .

NATURE, 1966, 212 (5058) :173-+

[9]

KING HW, 1965, ADV XRAY ANALYSIS, V8, P1

[10]

KING HW, 1967, ADV XRAY ANAL, V10, P354

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