STATIC SIMS, FABMS AND SIMS IMAGING IN APPLIED SURFACE-ANALYSIS

[31] WAUGH AR, 1983, 4TH P INT C SIMS OS

[32] WAUGH AR, 1982, 29TH P INT FIELD EM, P409

[33] CHARGING OF INSULATORS BY ION-BOMBARDMENT AND ITS MINIMIZATION FOR SECONDARY ION MASS-SPECTROMETRY (SIMS) MEASUREMENTS [J]. JOURNAL OF APPLIED PHYSICS, 1976, 47 (04) : 1232 - 1242

[34] WHITE CW, 1974, CHARACTERIZATION SOL, P641

[35] WILLIAMS DE, 1977, CHARACTERIZATION MET, V2, P53

[36] CHARACTERIZATION OF SOLIDS AND SURFACES USING ION-BEAMS AND MASS-SPECTROMETRY [J]. PROGRESS IN SOLID STATE CHEMISTRY, 1981, 13 (04) : 285 - 375

[37] Wittmaack K., 1973, International Journal of Mass Spectrometry and Ion Physics, V11, P23, DOI 10.1016/0020-7381(73)80052-X

[31] WAUGH AR, 1983, 4TH P INT C SIMS OS

[32] WAUGH AR, 1982, 29TH P INT FIELD EM, P409

[33] CHARGING OF INSULATORS BY ION-BOMBARDMENT AND ITS MINIMIZATION FOR SECONDARY ION MASS-SPECTROMETRY (SIMS) MEASUREMENTS [J]. JOURNAL OF APPLIED PHYSICS, 1976, 47 (04) : 1232 - 1242

[34] WHITE CW, 1974, CHARACTERIZATION SOL, P641

[35] WILLIAMS DE, 1977, CHARACTERIZATION MET, V2, P53

[36] CHARACTERIZATION OF SOLIDS AND SURFACES USING ION-BEAMS AND MASS-SPECTROMETRY [J]. PROGRESS IN SOLID STATE CHEMISTRY, 1981, 13 (04) : 285 - 375

[37] Wittmaack K., 1973, International Journal of Mass Spectrometry and Ion Physics, V11, P23, DOI 10.1016/0020-7381(73)80052-X