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LOW-TEMPERATURE PLASMA-ENHANCED EPITAXY OF GAAS
被引:24
作者
:
PANDE, KP
论文数:
0
引用数:
0
h-index:
0
机构:
NBS,DIV SEMICOND MAT & PROC,WASHINGTON,DC 20234
NBS,DIV SEMICOND MAT & PROC,WASHINGTON,DC 20234
PANDE, KP
[
1
]
SEABAUGH, AC
论文数:
0
引用数:
0
h-index:
0
机构:
NBS,DIV SEMICOND MAT & PROC,WASHINGTON,DC 20234
NBS,DIV SEMICOND MAT & PROC,WASHINGTON,DC 20234
SEABAUGH, AC
[
1
]
机构
:
[1]
NBS,DIV SEMICOND MAT & PROC,WASHINGTON,DC 20234
来源
:
JOURNAL OF THE ELECTROCHEMICAL SOCIETY
|
1984年
/ 131卷
/ 06期
关键词
:
D O I
:
10.1149/1.2115821
中图分类号
:
O646 [电化学、电解、磁化学];
学科分类号
:
081704 ;
摘要
:
引用
收藏
页码:1357 / 1359
页数:3
相关论文
共 8 条
[1]
HIGH-PURITY GAAS PREPARED FROM TRIMETHYLGALLIUM AND ARSINE
DAPKUS, PD
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS,DEPT ELECT ENGN,URBANA,IL 61801
UNIV ILLINOIS,DEPT ELECT ENGN,URBANA,IL 61801
DAPKUS, PD
MANASEVIT, HM
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS,DEPT ELECT ENGN,URBANA,IL 61801
UNIV ILLINOIS,DEPT ELECT ENGN,URBANA,IL 61801
MANASEVIT, HM
HESS, KL
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS,DEPT ELECT ENGN,URBANA,IL 61801
UNIV ILLINOIS,DEPT ELECT ENGN,URBANA,IL 61801
HESS, KL
LOW, TS
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS,DEPT ELECT ENGN,URBANA,IL 61801
UNIV ILLINOIS,DEPT ELECT ENGN,URBANA,IL 61801
LOW, TS
STILLMAN, GE
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS,DEPT ELECT ENGN,URBANA,IL 61801
UNIV ILLINOIS,DEPT ELECT ENGN,URBANA,IL 61801
STILLMAN, GE
[J].
JOURNAL OF CRYSTAL GROWTH,
1981,
55
(01)
: 10
-
23
[2]
NEW METHOD FOR GROWING GAAS EPILAYERS BY LOW-PRESSURE ORGANOMETALLICS
DUCHEMIN, JP
论文数:
0
引用数:
0
h-index:
0
机构:
Thomson C.S.F., Department Micro électronique Hyperfréquence, Domaine de Corbeville
DUCHEMIN, JP
BONNET, M
论文数:
0
引用数:
0
h-index:
0
机构:
Thomson C.S.F., Department Micro électronique Hyperfréquence, Domaine de Corbeville
BONNET, M
KOELSCH, F
论文数:
0
引用数:
0
h-index:
0
机构:
Thomson C.S.F., Department Micro électronique Hyperfréquence, Domaine de Corbeville
KOELSCH, F
HUYGHE, D
论文数:
0
引用数:
0
h-index:
0
机构:
Thomson C.S.F., Department Micro électronique Hyperfréquence, Domaine de Corbeville
HUYGHE, D
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1979,
126
(07)
: 1134
-
1149
[3]
HARIU T, I PHYSICS C SERIES, P141
[4]
HOLLAN L, 1980, CURRENT TOPICS MATER, V5, P1
[5]
ELECTRON CHANNELING PATTERNS IN THE SCANNING ELECTRON-MICROSCOPE
JOY, DC
论文数:
0
引用数:
0
h-index:
0
机构:
NBS, WASHINGTON, DC 20234 USA
JOY, DC
NEWBURY, DE
论文数:
0
引用数:
0
h-index:
0
机构:
NBS, WASHINGTON, DC 20234 USA
NEWBURY, DE
DAVIDSON, DL
论文数:
0
引用数:
0
h-index:
0
机构:
NBS, WASHINGTON, DC 20234 USA
DAVIDSON, DL
[J].
JOURNAL OF APPLIED PHYSICS,
1982,
53
(08)
: R81
-
R122
[6]
DEVICE QUALITY POLYCRYSTALLINE GALLIUM-ARSENIDE ON GERMANIUM-MOLYBDENUM SUBSTRATES
PANDE, K
论文数:
0
引用数:
0
h-index:
0
机构:
Department of Electrical and Systems Engineering, Rensselaer Polytechnic Institute, Troy
PANDE, K
REEP, D
论文数:
0
引用数:
0
h-index:
0
机构:
Department of Electrical and Systems Engineering, Rensselaer Polytechnic Institute, Troy
REEP, D
SRIVASTAVA, A
论文数:
0
引用数:
0
h-index:
0
机构:
Department of Electrical and Systems Engineering, Rensselaer Polytechnic Institute, Troy
SRIVASTAVA, A
TIWARI, S
论文数:
0
引用数:
0
h-index:
0
机构:
Department of Electrical and Systems Engineering, Rensselaer Polytechnic Institute, Troy
TIWARI, S
BORREGO, JM
论文数:
0
引用数:
0
h-index:
0
机构:
Department of Electrical and Systems Engineering, Rensselaer Polytechnic Institute, Troy
BORREGO, JM
GHANDHI, SK
论文数:
0
引用数:
0
h-index:
0
机构:
Department of Electrical and Systems Engineering, Rensselaer Polytechnic Institute, Troy
GHANDHI, SK
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1979,
126
(02)
: 300
-
304
[7]
PANDE KP, 1983, ELECTROCHEMICAL SOC, P201
[8]
THERMAL AND OPTICAL EMISSION AND CAPTURE RATES AND CROSS SECTIONS OF ELECTRONS AND HOLES AT IMPERFECTION CENTERS IN SEMICONDUCTORS FROM PHOTO AND DARK JUNCTION CURRENT AND CAPACITANCE EXPERIMENTS
SAH, CT
论文数:
0
引用数:
0
h-index:
0
SAH, CT
FORBES, L
论文数:
0
引用数:
0
h-index:
0
FORBES, L
ROSIER, LL
论文数:
0
引用数:
0
h-index:
0
ROSIER, LL
TASCH, AF
论文数:
0
引用数:
0
h-index:
0
TASCH, AF
[J].
SOLID-STATE ELECTRONICS,
1970,
13
(06)
: 759
-
+
←
1
→
共 8 条
[1]
HIGH-PURITY GAAS PREPARED FROM TRIMETHYLGALLIUM AND ARSINE
DAPKUS, PD
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS,DEPT ELECT ENGN,URBANA,IL 61801
UNIV ILLINOIS,DEPT ELECT ENGN,URBANA,IL 61801
DAPKUS, PD
MANASEVIT, HM
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS,DEPT ELECT ENGN,URBANA,IL 61801
UNIV ILLINOIS,DEPT ELECT ENGN,URBANA,IL 61801
MANASEVIT, HM
HESS, KL
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS,DEPT ELECT ENGN,URBANA,IL 61801
UNIV ILLINOIS,DEPT ELECT ENGN,URBANA,IL 61801
HESS, KL
LOW, TS
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS,DEPT ELECT ENGN,URBANA,IL 61801
UNIV ILLINOIS,DEPT ELECT ENGN,URBANA,IL 61801
LOW, TS
STILLMAN, GE
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS,DEPT ELECT ENGN,URBANA,IL 61801
UNIV ILLINOIS,DEPT ELECT ENGN,URBANA,IL 61801
STILLMAN, GE
[J].
JOURNAL OF CRYSTAL GROWTH,
1981,
55
(01)
: 10
-
23
[2]
NEW METHOD FOR GROWING GAAS EPILAYERS BY LOW-PRESSURE ORGANOMETALLICS
DUCHEMIN, JP
论文数:
0
引用数:
0
h-index:
0
机构:
Thomson C.S.F., Department Micro électronique Hyperfréquence, Domaine de Corbeville
DUCHEMIN, JP
BONNET, M
论文数:
0
引用数:
0
h-index:
0
机构:
Thomson C.S.F., Department Micro électronique Hyperfréquence, Domaine de Corbeville
BONNET, M
KOELSCH, F
论文数:
0
引用数:
0
h-index:
0
机构:
Thomson C.S.F., Department Micro électronique Hyperfréquence, Domaine de Corbeville
KOELSCH, F
HUYGHE, D
论文数:
0
引用数:
0
h-index:
0
机构:
Thomson C.S.F., Department Micro électronique Hyperfréquence, Domaine de Corbeville
HUYGHE, D
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1979,
126
(07)
: 1134
-
1149
[3]
HARIU T, I PHYSICS C SERIES, P141
[4]
HOLLAN L, 1980, CURRENT TOPICS MATER, V5, P1
[5]
ELECTRON CHANNELING PATTERNS IN THE SCANNING ELECTRON-MICROSCOPE
JOY, DC
论文数:
0
引用数:
0
h-index:
0
机构:
NBS, WASHINGTON, DC 20234 USA
JOY, DC
NEWBURY, DE
论文数:
0
引用数:
0
h-index:
0
机构:
NBS, WASHINGTON, DC 20234 USA
NEWBURY, DE
DAVIDSON, DL
论文数:
0
引用数:
0
h-index:
0
机构:
NBS, WASHINGTON, DC 20234 USA
DAVIDSON, DL
[J].
JOURNAL OF APPLIED PHYSICS,
1982,
53
(08)
: R81
-
R122
[6]
DEVICE QUALITY POLYCRYSTALLINE GALLIUM-ARSENIDE ON GERMANIUM-MOLYBDENUM SUBSTRATES
PANDE, K
论文数:
0
引用数:
0
h-index:
0
机构:
Department of Electrical and Systems Engineering, Rensselaer Polytechnic Institute, Troy
PANDE, K
REEP, D
论文数:
0
引用数:
0
h-index:
0
机构:
Department of Electrical and Systems Engineering, Rensselaer Polytechnic Institute, Troy
REEP, D
SRIVASTAVA, A
论文数:
0
引用数:
0
h-index:
0
机构:
Department of Electrical and Systems Engineering, Rensselaer Polytechnic Institute, Troy
SRIVASTAVA, A
TIWARI, S
论文数:
0
引用数:
0
h-index:
0
机构:
Department of Electrical and Systems Engineering, Rensselaer Polytechnic Institute, Troy
TIWARI, S
BORREGO, JM
论文数:
0
引用数:
0
h-index:
0
机构:
Department of Electrical and Systems Engineering, Rensselaer Polytechnic Institute, Troy
BORREGO, JM
GHANDHI, SK
论文数:
0
引用数:
0
h-index:
0
机构:
Department of Electrical and Systems Engineering, Rensselaer Polytechnic Institute, Troy
GHANDHI, SK
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1979,
126
(02)
: 300
-
304
[7]
PANDE KP, 1983, ELECTROCHEMICAL SOC, P201
[8]
THERMAL AND OPTICAL EMISSION AND CAPTURE RATES AND CROSS SECTIONS OF ELECTRONS AND HOLES AT IMPERFECTION CENTERS IN SEMICONDUCTORS FROM PHOTO AND DARK JUNCTION CURRENT AND CAPACITANCE EXPERIMENTS
SAH, CT
论文数:
0
引用数:
0
h-index:
0
SAH, CT
FORBES, L
论文数:
0
引用数:
0
h-index:
0
FORBES, L
ROSIER, LL
论文数:
0
引用数:
0
h-index:
0
ROSIER, LL
TASCH, AF
论文数:
0
引用数:
0
h-index:
0
TASCH, AF
[J].
SOLID-STATE ELECTRONICS,
1970,
13
(06)
: 759
-
+
←
1
→