GAMMA-RADIATION EFFECTS ON INTEGRATED INJECTION LOGIC CELLS

被引：7

作者：

PEASE, RL

GALLOWAY, KF

STEHLIN, RA

机构：

[1] USN,AMMUNITION DEPOT,STRATEGIC SYST & COMPONENTS DIV,TECH STAFF,CRANE,IN 47522

[2] SANDIA LABS,ALBUQUERQUE,NM

[3] NBS,WASHINGTON,DC 20234

[4] INDIANA UNIV,BLOOMINGTON,IN

[5] TEXAS INSTRUMENTS INC,SEMICONDUCTOR RES & DEV LAB,IC DESIGN CTR,DALLAS,TX 75222

来源：

IEEE TRANSACTIONS ON ELECTRON DEVICES | 1975年 / ED22卷 / 06期

关键词：

D O I：

10.1109/T-ED.1975.18134

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：348 / 351

页数：4

共 8 条

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ALLEN RA, 1974, FEB IEEE INT SOL STA, P16

[2] MERGED-TRANSISTOR LOGIC (MTL) - LOW-COST BIPOLAR LOGIC CONCEPT [J].

BERGER, HH ;

WIEDMANN, SK .

IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1972, SC 7 (05) :340-&

[3]

BUCHANNAN B, 1974, JUN GOV MICR APPL C, P86

[4] RADIATION FAILURE MODES IN CMOS INTEGRATED-CIRCUITS [J].

BURGHARD, RA ;

GWYN, CW .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1973, NS20 (06) :300-306

[5]

DETROYE NC, 1974, FEB IEEE SOL STAT CI, P12

[6] INTEGRATED INJECTION LOGIC - NEW APPROACH TO LSI [J].

HART, K ;

SLOB, A .

IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1972, SC 7 (05) :346-&

[7] CMOS HARDENING TECHNIQUES [J].

SCHLESIER, KM ;

NORRIS, PE .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1972, NS19 (06) :275-281

[8] INJECTION-COUPLED MEMORY - HIGH-DENSITY STATIC BIPOLAR MEMORY [J].

WIEDMANN, SK .

IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1973, SC 8 (05) :332-336

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