FIELD AND HOT CARRIER ENHANCED LEAKAGE IN INGAASP/INP HETEROJUNCTIONS

被引：16

作者：

CHIU, LC

YU, KL

MARGALIT, S

CHEN, TR

KOREN, U

HASSON, A

YARIV, A

机构：

来源：

IEEE JOURNAL OF QUANTUM ELECTRONICS | 1983年 / 19卷 / 09期

关键词：

D O I：

10.1109/JQE.1983.1072052

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：1335 / 1338

页数：4

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