COMPUTER-SIMULATION AND CONTROLLED GROWTH OF LARGE DIAMETER CZOCHRALSKI SILICON-CRYSTALS

被引:22
作者
KIM, KM
KRAN, A
SMETANA, P
SCHWUTTKE, GH
机构
关键词
D O I
10.1149/1.2119907
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
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页码:1156 / 1160
页数:5
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共 11 条
[1]  
Arizumi T., 1972, Journal of Crystal Growth, V13-14, P615, DOI 10.1016/0022-0248(72)90529-5
[3]   EFFECT OF THE SOLIDIFICATION FRONT SHAPE ON THE TEMPERATURE DISTRIBUTION IN THE CRYSTAL [J].
BORODIN, VA ;
DAVIDOVA, LB ;
EROFEEV, VN ;
SHDANOV, AV ;
STARTSEV, SA ;
TATARCHENKO, VA .
JOURNAL OF CRYSTAL GROWTH, 1979, 46 (06) :757-762
[4]  
Brice J. C., 1968, Journal of Crystal Growth, V2, P395, DOI 10.1016/0022-0248(68)90035-3
[5]   NUMERICAL ANALYSES OF SOLID-LIQUID INTERFACE SHAPES DURING CRYSTAL GROWTH BY CZOCHRALSKI METHOD [J].
KOBAYASHI, N ;
ARIZUMI, T .
JAPANESE JOURNAL OF APPLIED PHYSICS, 1970, 9 (04) :361-+
[6]  
KRAN A, 1983, J ELCHEM SO, V130, P1156
[7]   INFLUENCE OF CRYSTAL DIMENSIONS ON INTERFACIAL TEMPERATURE GRADIENT [J].
KUO, VHS ;
WILCOX, WR .
JOURNAL OF CRYSTAL GROWTH, 1972, 12 (03) :191-&
[8]   CZOCHRALSKI SILICON PULL RATE LIMITS [J].
REA, SN .
JOURNAL OF CRYSTAL GROWTH, 1981, 54 (02) :267-274
[9]  
RIEDLING K, UNPUB J CRYST GROWTH
[10]  
RUNYAN WR, 1965, SILICON SEMICONDUCTO, P40