ELECTRON-ENERGY LOSS SPECTROSCOPY ACROSS A METAL-INSULATOR INTERFACE AT SUB-NANOMETER SPATIAL-RESOLUTION

被引：37

作者：

SCHEINFEIN, M ^{[1
]}

MURAY, A ^{[1
]}

ISAACSON, M ^{[1
]}

机构：

[1] CORNELL UNIV, NATL RES & RESOURCE FACIL SUBMICRON STRUCT, ITHACA, NY 14853 USA

来源：

ULTRAMICROSCOPY | 1985年 / 16卷 / 02期

关键词：

D O I：

10.1016/0304-3991(85)90077-4

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：233 / 239

页数：7

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