CHARACTERIZATION OF OPTICAL COATINGS WITH BACKSCATTERING SPECTROMETRY

[1] Chu W. K., 1978, BACKSCATTERING SPECT

[2] FALCO CM, 1986, P SPIE, V733, P343

[3] CHARACTERIZATION OF MULTILAYERS FOR EXTENDED ULTRAVIOLET OPTICS [J]. APPLIED PHYSICS LETTERS, 1987, 51 (12) : 880 - 882

[4] ION-BEAM ANALYSIS WITH A 6-MV VANDEGRAAFF [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1987, 24-5 : 717 - 721

[5] CROSS-SECTIONS FOR 170-DEGREES BACKSCATTERING OF HE-4 FROM OXYGEN, ALUMINUM AND ARGON FOR HE-4 ENERGIES BETWEEN 1.8 AND 5.0 MEV [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1986, 15 (1-6) : 296 - 299

[6] MCINTYRE LC, 1987, MATER RES SOC S P, V93, P401

[7] Targove J. D., 1986, Proceedings of the SPIE - The International Society for Optical Engineering, V678, P115, DOI 10.1117/12.939545

[1] Chu W. K., 1978, BACKSCATTERING SPECT

[2] FALCO CM, 1986, P SPIE, V733, P343

[3] CHARACTERIZATION OF MULTILAYERS FOR EXTENDED ULTRAVIOLET OPTICS [J]. APPLIED PHYSICS LETTERS, 1987, 51 (12) : 880 - 882

[4] ION-BEAM ANALYSIS WITH A 6-MV VANDEGRAAFF [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1987, 24-5 : 717 - 721

[5] CROSS-SECTIONS FOR 170-DEGREES BACKSCATTERING OF HE-4 FROM OXYGEN, ALUMINUM AND ARGON FOR HE-4 ENERGIES BETWEEN 1.8 AND 5.0 MEV [J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1986, 15 (1-6) : 296 - 299

[6] MCINTYRE LC, 1987, MATER RES SOC S P, V93, P401

[7] Targove J. D., 1986, Proceedings of the SPIE - The International Society for Optical Engineering, V678, P115, DOI 10.1117/12.939545