ION-BEAM ANALYSIS WITH A 6-MV VANDEGRAAFF

被引:28
作者
LEAVITT, JA
机构
关键词
D O I
10.1016/S0168-583X(87)80232-X
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
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页码:717 / 721
页数:5
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