PREPARATION OF X-RAY-LITHOGRAPHY MASKS USING A TUNGSTEN REACTIVE ION ETCHING PROCESS

被引:8
作者
RANDALL, JN [1 ]
WOLFE, JC [1 ]
机构
[1] UNIV HOUSTON,DEPT ELECT ENGN,HOUSTON,TX 77004
关键词
D O I
10.1063/1.93483
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:247 / 248
页数:2
相关论文
共 5 条
[1]  
BUCKLEY WD, 1980, 8TH P INT C EL ION B, P434
[2]   POLYIMIDE MEMBRANE X-RAY LITHOGRAPHY MASKS - FABRICATION AND DISTORTION MEASUREMENTS [J].
FLANDERS, DC ;
SMITH, HI .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1978, 15 (03) :995-997
[3]   COLORLESS, TRANSPARENT, C-ORIENTED ALUMINUM NITRIDE FILMS GROWN AT LOW-TEMPERATURE BY A MODIFIED SPUTTER GUN [J].
ONISHI, S ;
ESCHWEI, M ;
BIELACZY, S ;
WANG, WC .
APPLIED PHYSICS LETTERS, 1981, 39 (08) :643-645
[4]  
ORO JA, UNPUB
[5]   HIGH-RESOLUTION PATTERN DEFINITION IN TUNGSTEN [J].
RANDALL, JN ;
WOLFE, JC .
APPLIED PHYSICS LETTERS, 1981, 39 (09) :742-743