MEASUREMENT OF RADII OF CURVATURE OF SLIGHTLY BENT CRYSTALS USING A ONE-DIMENSIONAL DETECTOR

被引：4

作者：

GAO, DC ^{[1
]}

WILKINS, SW ^{[1
]}

STEVENSON, AW ^{[1
]}

POGANY, AP ^{[1
]}

机构：

[1] ROYAL MELBOURNE INST TECHNOL,DEPT APPL PHYS,MELBOURNE,VIC 3001,AUSTRALIA

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1993年 / 64卷 / 09期

关键词：

D O I：

10.1063/1.1143867

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A new x-ray diffraction method is described for measuring radii of curvature of crystals using a one-dimensional solid-state detector together with an extremely parallel incident x-ray beam. The present method is based on the measurement of the slope of loci of rocking curve maximum in a contour map of x-ray rocking curves versus position on the sample. The detection limit for the radius of curvature is estimated to be a few thousand meters using this method. The local variation of the curvature over a sample is easily revealed and precisely determined from the contour map of x-ray rocking curves. Several examples of curvature determination by the present method are presented and compared with the results of the commonly used double-crystal diffractometer method.

引用

页码：2561 / 2565

页数：5

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