EFFECTS OF SUBSTRATE-TEMPERATURE ON THE ORIENTATION OF ULTRAHIGH-VACUUM EVAPORATE SI AND GE FILMS

被引:17
作者
CHAO, SS [1 ]
GONZALEZHERNANDEZ, J [1 ]
MARTIN, D [1 ]
TSU, R [1 ]
机构
[1] INST FIS & QUIM SAO CARLOS,BR-13560 SAO CARLOS,SP,BRAZIL
关键词
D O I
10.1063/1.95771
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:1089 / 1091
页数:3
相关论文
共 14 条
[1]  
Donnay JDH, 1937, AM MINERAL, V22, P446
[2]   DENSITY OF SIO2-SI INTERFACE STATES - (MOS DEVICES SI OXIDATION 100 DEGREES C O2 + 80 PPM H2O FERMI LEVEL E) [J].
GRAY, PV ;
BROWN, DM .
APPLIED PHYSICS LETTERS, 1966, 8 (02) :31-&
[3]  
Hernandez J.G., 1984, APPL PHYS LETT, V44, P672
[4]  
HERNANDEZ JG, 1984, APPL PHYS LETT, V45, P101
[5]   STRUCTURE OF CHEMICALLY DEPOSITED POLYCRYSTALLINE-SILICON FILMS [J].
KAMINS, TI ;
CASS, TR .
THIN SOLID FILMS, 1973, 16 (02) :147-165
[6]  
KWIZERA P, 1982, APPL PHYS LETT, V41, P379, DOI 10.1063/1.93502
[7]   WIDE-RANGE CONTROL OF CRYSTALLITE SIZE AND ITS ORIENTATION IN GLOW-DISCHARGE DEPOSITED MU-C-SI-H [J].
MATSUDA, A ;
KUMAGAI, K ;
TANAKA, K .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1983, 22 (01) :L34-L36
[8]   THIN-FILM TRANSISTORS ON MOLECULAR-BEAM-DEPOSITED POLYCRYSTALLINE SILICON [J].
MATSUI, M ;
SHIRAKI, Y ;
MARUYAMA, E ;
OHWADA, J .
JOURNAL OF APPLIED PHYSICS, 1984, 55 (06) :1590-1595
[9]   LOW-TEMPERATURE FORMATION OF POLYCRYSTALLINE SILICON FILMS BY MOLECULAR-BEAM DEPOSITION [J].
MATSUI, M ;
SHIRAKI, Y ;
MARUYAMA, E .
JOURNAL OF APPLIED PHYSICS, 1982, 53 (02) :995-998
[10]  
MORIN F, 1982, J APPL PHYS, V53, P3898