QUANTUM TRANSMITTANCE FROM LOW-TEMPERATURE BALLISTIC-ELECTRON-EMISSION SPECTROSCOPY OF AU/SI(100) SCHOTTKY INTERFACES

被引：27

作者：

HENDERSON, GN

FIRST, PN

GAYLORD, TK

GLYTSIS, EN

机构：

[1] GEORGIA INST TECHNOL,SCH ELECT ENGN,ATLANTA,GA 30332

[2] GEORGIA INST TECHNOL,SCH PHYS,ATLANTA,GA 30332

来源：

PHYSICAL REVIEW LETTERS | 1993年 / 71卷 / 18期

关键词：

D O I：

10.1103/PhysRevLett.71.2999

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

Ballistic electron emission microscopy studies of the Au/Si(100) interface have been performed at temperatures below 77 K for the first time. Spectra below 10 K show collector charging due to the high semiconductor resistivity. Results above 10 K demonstrate unambiguously that both quantum-mechanical phase and amplitude effects are required to describe electron transmission across a metal-semiconductor interface. Furthermore, the ballistic (collisionless) model of electron transmission across this interface is shown to be valid for a wide energy range.

引用

页码：2999 / 3002

页数：4

共 20 条

[1] NEW ELECTRON AND HOLE SPECTROSCOPIES BASED ON BALLISTIC ELECTRON-EMISSION MICROSCOPY
BELL, LD
KAISER, WJ
HECHT, MH
DAVIS, LC
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1991, 9 (02): : 594 - 600
[2] OBSERVATION OF INTERFACE BAND-STRUCTURE BY BALLISTIC-ELECTRON-EMISSION MICROSCOPY
BELL, LD
KAISER, WJ
[J]. PHYSICAL REVIEW LETTERS, 1988, 61 (20) : 2368 - 2371
[3] AN EASILY OPERABLE SCANNING TUNNELING MICROSCOPE
BESOCKE, K
[J]. SURFACE SCIENCE, 1987, 181 (1-2) : 145 - 153
[4] THEORY OF HOLE REFRACTIONS FROM HETEROJUNCTIONS
CHUANG, SL
[J]. PHYSICAL REVIEW B, 1989, 40 (15): : 10379 - 10390
[5] PROBING HETEROJUNCTIONS BY BALLISTIC ELECTRON-EMISSION MICROSCOPY
FOWELL, AE
CAFOLLA, AA
RICHARDSON, BE
SHEN, TH
ELLIOTT, M
WESTWOOD, DI
WILLIAMS, RH
[J]. APPLIED SURFACE SCIENCE, 1992, 56-8 : 622 - 627
[6] HOT-ELECTRON INTERACTIONS AT THE PASSIVATED GOLD-SILICON INTERFACE
HALLEN, HD
HUANG, T
FERNANDEZ, A
SILCOX, J
BUHRMAN, RA
[J]. PHYSICAL REVIEW LETTERS, 1992, 69 (20) : 2931 - 2934
[7] SCATTERING AND SPECTRAL SHAPE IN BALLISTIC-ELECTRON-EMISSION MICROSCOPY OF NISI2-SI(111) AND AU-SI SAMPLES
HALLEN, HD
FERNANDEZ, A
HUANG, T
SILCOX, J
BUHRMAN, RA
[J]. PHYSICAL REVIEW B, 1992, 46 (11): : 7256 - 7259
[8] ROLE OF PHOTOCURRENT IN LOW-TEMPERATURE PHOTOEMISSION-STUDIES OF SCHOTTKY-BARRIER FORMATION
HECHT, MH
[J]. PHYSICAL REVIEW B, 1990, 41 (11): : 7918 - 7921
[9] BALLISTIC-ELECTRON-EMISSION MICROSCOPY INVESTIGATION OF SCHOTTKY-BARRIER INTERFACE FORMATION
HECHT, MH
BELL, LD
KAISER, WJ
GRUNTHANER, FJ
[J]. APPLIED PHYSICS LETTERS, 1989, 55 (08) : 780 - 782
[10] HENDERESON GH, 1991, P IEEE, V79, P591

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