High resolution syncrotron radiation Si 2p core-level spectroscopy of Si(110)16x2

被引：7

作者：

Cricenti, A

LeLay, G

Aristov, VY

Nesterenko, B

Safta, N

Lacharme, JP

Sebenne, CA

TalebIbrahimi, A

Indlekofer, G

机构：

[1] UPR CNRS 7251,CRMC2,F-13288 MARSEILLE 9,FRANCE

[2] INST SEMICOND PHYS,KIEV 252650,UKRAINE

[3] UNIV PARIS 06,URA CNRS 154,PHYS SOLIDES LAB,F-75252 PARIS 05,FRANCE

[4] UNIV PARIS 11,LURE,F-91405 ORSAY,FRANCE

来源：

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA | 1995年 / 76卷

关键词：

D O I：

10.1016/0368-2048(95)02505-7

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

The clean Si(110)16x2 surface has been studied by high resolution synchrotron radiation core-level spectroscopy. A comparative detailed study of the Si 2p line with an experimental resolution better than 80 meV has been performed. The Si 2p spectra display strong similarities with those from the Si(111)7x7 recontruction pointing to the presence on the 16x2 reconstruction of building blocks (adatoms, rest atoms, pedestal and dimer atoms) similar to the 7x7 one.

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页码：613 / 617

页数：5

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