ARXPS-BASED CONCENTRATION PROFILES RESTORATION APPLIED TO ADSORBATE METAL SYSTEMS

Depth concentration profiles for the O2/Ir(111), CO/Ir(111) and O2/Ag adsorbate/metal systems have been obtained by means of the numerical analysis of the ARXPS data. For the O2/Ir(111) and CO/Ir(111) systems our technique has been found to yield correct coverage estimates and elements in-depth distributions with near-atomic resolution. For the O2/Ag system the oxygen atoms with E(BO 1s) = 528.4 eV have been shown to incorporate between two upper substrate layers, while being completely absent on the surface. The oxygen atoms with E(BO 1s) = 530.5 eV behave quite differently, being present both upon the surface and in the outermost substrate layer.