ARXPS-BASED CONCENTRATION PROFILES RESTORATION APPLIED TO ADSORBATE METAL SYSTEMS

被引:18
作者
BASCHENKO, OA [1 ]
BUKHTIYAROV, VI [1 ]
BORONIN, AI [1 ]
机构
[1] NOVOSIBIRSK CATALYSIS INST,NOVOSIBIRSK 630090,USSR
关键词
D O I
10.1016/0039-6028(92)90910-X
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Depth concentration profiles for the O2/Ir(111), CO/Ir(111) and O2/Ag adsorbate/metal systems have been obtained by means of the numerical analysis of the ARXPS data. For the O2/Ir(111) and CO/Ir(111) systems our technique has been found to yield correct coverage estimates and elements in-depth distributions with near-atomic resolution. For the O2/Ag system the oxygen atoms with E(BO 1s) = 528.4 eV have been shown to incorporate between two upper substrate layers, while being completely absent on the surface. The oxygen atoms with E(BO 1s) = 530.5 eV behave quite differently, being present both upon the surface and in the outermost substrate layer.
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页码:493 / 500
页数:8
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