SURFACE-MORPHOLOGY OF LEAD-BASED THIN-FILMS AND THEIR PROPERTIES

被引:55
作者
ATSUKI, T [1 ]
SOYAMA, N [1 ]
SASAKI, G [1 ]
YONEZAWA, T [1 ]
OGI, K [1 ]
SAMESHIMA, K [1 ]
HOSHIBA, K [1 ]
NAKAO, Y [1 ]
KAMISAWA, A [1 ]
机构
[1] ROHM CO LTD, UKYO KU, KYOTO 615, JAPAN
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS | 1994年 / 33卷 / 9B期
关键词
FERROELECTRIC; PZT; THIN FILMS; SURFACE MORPHOLOGY; SOL-GEL;
D O I
10.1143/JJAP.33.5196
中图分类号
O59 [应用物理学];
学科分类号
摘要
Surface morphology of lead-zirconate-titanate [PZT(52/48)] thin films prepared by sol-gel processing on Pt/Ti/ SiO2/Si substrates was studied. When the atomic ratio [Pb/(Zr + Ti)] of PZT gel films was 1, rosette structure was observed in the films after annealing at 600 degrees C for one hour. The crystal structure of the rosette was identified as perovskite and that of the other area was nonperovskite, by electron diffraction analysis. Lead deficiency in the non-perovskite phase caused by lead diffusion into the bottom electrode was detected by energy dispersive X-ray spectroscopy and Auger electron spectroscopy. In order to prepare PZT films with a smooth surface, the following four means were efficient: addition of lead excess, rapid thermal annealing (RTA), adoption of buffer layer, and preparation of crystal nucleus on the substrate.
引用
收藏
页码:5196 / 5200
页数:5
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