NOVEL AND NONINTRUSIVE OPTICAL THERMOMETER

被引：8

作者：

GUIDOTTI, D ^{[1
]}

WILMAN, JG ^{[1
]}

机构：

[1] IBM CORP,E FISHKILL FACIL,HOPEWELL JUNCTION,NY 12533

来源：

APPLIED PHYSICS LETTERS | 1992年 / 60卷 / 05期

关键词：

D O I：

10.1063/1.107440

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We have developed a novel thermometer based on the small temperature-induced changes in the optical reflectivity of metals and semiconductors. A nulling optical bridge has been constructed which reduces the temperature measurement to the shot noise limit of the detector. Under ideal laboratory conditions, we have demonstrated a temperature resolution of 0.2-degrees-C.

引用

页码：524 / 526

页数：3

共 6 条

[1]

BATZ B, 1972, SEMICONDUCT SEMIMET, V9, P315

[2]

CARDONA M, 1969, SOLID STATE PHYS S, V11, P117

[3] THE TEMPERATURE-DEPENDENCE OF THE REFRACTIVE-INDEX OF SILICON AT ELEVATED-TEMPERATURES AT SEVERAL LASER WAVELENGTHS [J].