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ROTATING SAMPLE TECHNIQUE FOR MEASUREMENT OF RANDOM BACKSCATTERING YIELDS FROM CRYSTALS AND ITS APPLICATION TO BETA-ALUMINA
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PRECISE PROFILES FOR ARSENIC IMPLANTED IN SI AND SIO2 OVER A WIDE IMPLANTATION ENERGY-RANGE (10 KEV-2.56 MEV)
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JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS,
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HIGH-RESOLUTION RUTHERFORD BACKSCATTERING SPECTROMETRY AND THE ANALYSIS OF VERY THIN SILICON-NITRIDE LAYERS
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APPLICATION OF HIGH-RESOLUTION RUTHERFORD BACKSCATTERING TECHNIQUES TO NEAR-SURFACE ANALYSIS
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Ziegler J.F., 1977, HELIUM STOPPING POWE, V4