EFFECTIVE MEDIUM THEORY AND ANGULAR-DISPERSION OF OPTICAL-CONSTANTS IN FILMS WITH OBLIQUE COLUMNAR STRUCTURE

被引:69
作者
SMITH, GB [1 ]
机构
[1] CHALMERS UNIV TECHNOL,DEPT PHYS,S-41296 GOTHENBURG,SWEDEN
关键词
22;
D O I
10.1016/0030-4018(89)90008-4
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
引用
收藏
页码:279 / 284
页数:6
相关论文
共 22 条
[1]   INVESTIGATION OF EFFECTIVE-MEDIUM MODELS OF MICROSCOPIC SURFACE-ROUGHNESS BY SPECTROSCOPIC ELLIPSOMETRY [J].
ASPNES, DE ;
THEETEN, JB .
PHYSICAL REVIEW B, 1979, 20 (08) :3292-3302
[2]   OPTICAL-PROPERTIES OF THIN-FILMS [J].
ASPNES, DE .
THIN SOLID FILMS, 1982, 89 (03) :249-262
[4]   GENERALIZED MAXWELL GARNETT EQUATIONS FOR ROUGH SURFACES [J].
CHAN, EC ;
MARTON, JP .
JOURNAL OF APPLIED PHYSICS, 1974, 45 (11) :5004-5007
[6]   REFRACTIVE-INDEX VARIATIONS IN DIELECTRIC FILMS HAVING COLUMNAR MICROSTRUCTURE [J].
HARRIS, M ;
BOWDEN, M ;
MACLEOD, HA .
OPTICS COMMUNICATIONS, 1984, 51 (01) :29-32
[7]   MEASUREMENT OF THE PRINCIPAL REFRACTIVE-INDEXES OF THIN-FILMS DEPOSITED AT OBLIQUE-INCIDENCE [J].
HODGKINSON, IJ ;
HOROWITZ, F ;
MACLEOD, HA ;
SIKKENS, M ;
WHARTON, JJ .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 1985, 2 (10) :1693-1697
[8]  
KIVAISI RT, 1983, P SOC PHOTO-OPT INST, V428, P32, DOI 10.1117/12.936297
[9]   OPTICAL-PROPERTIES OF OBLIQUELY EVAPORATED ALUMINUM FILMS [J].
KIVAISI, RT .
THIN SOLID FILMS, 1982, 97 (02) :153-163
[10]   ELECTROMAGNETIC PROPAGATION AT INTERFACES AND IN WAVE-GUIDES IN UNIAXIAL CRYSTALS - SURFACE IMPEDANCE ADMITTANCE APPROACH [J].
KNOESEN, A ;
MOHARAM, MG ;
GAYLORD, TK .
APPLIED PHYSICS B-PHOTOPHYSICS AND LASER CHEMISTRY, 1985, 38 (03) :171-178