CONTRIBUTION TO DIRECT MEASUREMENT OF DOUBLE-LAYER POTENTIAL AT THE OXIDE ELECTROLYTE INTERFACE

被引：19

作者：

CICHOS, C

GEIDEL, T

机构：

来源：

COLLOID AND POLYMER SCIENCE | 1983年 / 261卷 / 11期

关键词：

D O I：

10.1007/BF01451674

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：947 / 953

页数：7

共 10 条

[1] STUDIES OF DOUBLE LAYER AT OXIDE-SOLUTION INTERFACE [J].

AHMED, SM .

JOURNAL OF PHYSICAL CHEMISTRY, 1969, 73 (11) :3546-&

[2] DEVELOPMENT, OPERATION, AND APPLICATION OF ION-SENSITIVE FIELD-EFFECT TRANSISTOR AS A TOOL FOR ELECTROPHYSIOLOGY [J].

BERGVELD, P .

IEEE TRANSACTIONS ON BIOMEDICAL ENGINEERING, 1972, BM19 (05) :342-&

[3] SEMICONDUCTOR FIELD-EFFECT FOR MEASUREMENT OF DOUBLE-LAYER POTENTIAL ON OXIDE-ELECTROLYTE INTERFACES [J].

CICHOS, C ;

GEIDEL, T .

COLLOID AND POLYMER SCIENCE, 1978, 256 (11) :1140-1141

[4]

CICHOS C, 1980, FIZIKOCHEMICZNE PROB, V12, P57

[5]

Grove A S, 1967, PHYS TECHNOLOGY SEMI

[6]

LOHMANN F, 1966, BERICH BUNSEN GESELL, V70, P428

[7] TRANSISTOR METHOD FOR MEASURING CHANGES IN DOUBLE-LAYER POTENTIALS [J].

SCHENCK, JF .

JOURNAL OF COLLOID AND INTERFACE SCIENCE, 1977, 61 (03) :569-576

[8]

SCHWABE K, 1963, PH MESSTECHNIK

[9] PHYSICAL AND DIELECTRIC PROPERTIES OF THE METAL-SILICON DIOXIDE-SILICON SYSTEM [J].

SPRAGUE, JL ;

MINAHAN, JA ;

WIED, OJ .

JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1962, 109 (02) :94-98

[10] ZERO POINT OF CHARGE OF ALPHA-ALUMINA [J].

YOPPS, JA ;

FUERSTENAU, DW .

JOURNAL OF COLLOID SCIENCE, 1964, 19 (01) :61-&

← 1 →