TRANSISTOR METHOD FOR MEASURING CHANGES IN DOUBLE-LAYER POTENTIALS

被引：27

作者：

SCHENCK, JF

机构：

[1] GE,CTR RES & DEV,SCHENECTADY,NY 12301

[2] UNION UNIV,ALBANY MED COLL,ALBANY,NY 12208

来源：

JOURNAL OF COLLOID AND INTERFACE SCIENCE | 1977年 / 61卷 / 03期

关键词：

D O I：

10.1016/0021-9797(77)90474-X

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：569 / 576

页数：8

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