CALIBRATION OF MICRO-PIXE ANALYSIS OF SULFIDE MINERALS

被引：18

作者：

CAMPBELL, JL

CABRI, LJ

ROGERS, PSZ

TRAXEL, K

BENJAMIN, TM

机构：

[1] UNIV HEIDELBERG,INST PHYS,D-6900 HEIDELBERG,FED REP GER

[2] UNIV CALIF LOS ALAMOS NATL LAB,LOS ALAMOS,NM 87545

[3] CANADA CTR MINERAL & ENERGY TECHNOL,OTTAWA K1A 0G1,ONTARIO,CANADA

来源：

关键词：

D O I：

10.1016/0168-583X(87)90374-0

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：437 / 441

页数：5

共 8 条

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BUSECK PR, 1969, GEOL SOC AM BULL, V80, P2141, DOI 10.1130/0016-7606(1969)80[2141:OCACRO]2.0.CO

[2]

[3]

CABRI LJ, 1985, CAN MINERAL, V23, P133

[4]

CABRI LJ, 1986, 14TH INT MIN ASS GEN

[5] UNCERTAINTIES IN THICK-TARGET PIXE ANALYSIS [J].

CAMPBELL, JL ;

COOKSON, JA ;

PAUL, H .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH, 1983, 212 (1-3) :427-439

[6] PIXE ANALYSIS OF THICK TARGETS [J].

CAMPBELL, JL ;

COOKSON, JA .

[7]

Leroux J., 1977, REVISED TABLES MASS

[8]

MCINTYRE NS, 1984, SCANNING ELECTRON MI, V111, P1139