ON-CHIP PICOSECOND TIME-DOMAIN MEASUREMENTS FOR VLSI AND INTERCONNECT TESTING USING PHOTOCONDUCTORS

被引：6

作者：

EISENSTADT, WR

HAMMOND, RB

DUTTON, RW

机构：

[1] STANFORD UNIV, INTEGRATED CIRCUITS LAB, STANFORD, CA 94305 USA

[2] UNIV CALIF LOS ALAMOS NATL LAB, DIV ELECTR, LOS ALAMOS, NM 87545 USA

来源：

IEEE TRANSACTIONS ON ELECTRON DEVICES | 1985年 / 32卷 / 02期

关键词：

D O I：

10.1109/T-ED.1985.21950

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：364 / 369

页数：6

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