SURFACE PROFILING BY PHASE-LOCKED INTERFEROMETRY

[1] HAMILTON DK, 1985, OPTIK, V71, P31

[2] A CONFOCAL INTERFERENCE MICROSCOPE [J]. OPTICA ACTA, 1982, 29 (12): : 1573 - 1577

[3] OPTICAL HETERODYNE PROFILOMETER [J]. OPTICAL ENGINEERING, 1984, 23 (04) : 365 - 370

[4] PHASE SENSITIVE SCANNING OPTICAL MICROSCOPE [J]. APPLIED PHYSICS LETTERS, 1984, 45 (08) : 846 - 848

[5] REAL-TIME PHASE MICROSCOPY USING A PHASE-LOCK INTERFEROMETER [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1978, 49 (12) : 1702 - 1705

[6] EFFECTS OF HIGH ANGLES OF CONVERGENCE ON V(Z) IN THE SCANNING ACOUSTIC MICROSCOPE [J]. APPLIED PHYSICS LETTERS, 1981, 38 (11) : 858 - 859

[7] OPTICAL HETERODYNE PROFILOMETRY [J]. APPLIED OPTICS, 1981, 20 (04): : 610 - 618

[8] YARIV A, 1967, QUANTUM ELECTRONICS, P341

[1] HAMILTON DK, 1985, OPTIK, V71, P31

[2] A CONFOCAL INTERFERENCE MICROSCOPE [J]. OPTICA ACTA, 1982, 29 (12): : 1573 - 1577

[3] OPTICAL HETERODYNE PROFILOMETER [J]. OPTICAL ENGINEERING, 1984, 23 (04) : 365 - 370

[4] PHASE SENSITIVE SCANNING OPTICAL MICROSCOPE [J]. APPLIED PHYSICS LETTERS, 1984, 45 (08) : 846 - 848

[5] REAL-TIME PHASE MICROSCOPY USING A PHASE-LOCK INTERFEROMETER [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1978, 49 (12) : 1702 - 1705

[6] EFFECTS OF HIGH ANGLES OF CONVERGENCE ON V(Z) IN THE SCANNING ACOUSTIC MICROSCOPE [J]. APPLIED PHYSICS LETTERS, 1981, 38 (11) : 858 - 859

[7] OPTICAL HETERODYNE PROFILOMETRY [J]. APPLIED OPTICS, 1981, 20 (04): : 610 - 618

[8] YARIV A, 1967, QUANTUM ELECTRONICS, P341