ANALYSIS OF GROWING FILMS OF COMPLEX OXIDES BY RHEED

被引：37

作者：

BOZOVIC, I

ECKSTEIN, JN

机构：

来源：

MRS BULLETIN | 1995年 / 20卷 / 05期

关键词：

D O I：

10.1557/S0883769400044870

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

[No abstract available]

引用

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页码：32 / 38

页数：7

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[5] ATOMIC LAYER-BY-LAYER ENGINEERING OF HIGH T(C) MATERIALS AND HETEROSTRUCTURE DEVICES
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[6] ECKSTEIN JN, 1993, MRS BULL, V18, P27
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[8] COLOSSAL MAGNETORESISTANCE IN LA-CA-MN-O FERROMAGNETIC THIN-FILMS (INVITED)
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[9] INSITU X-RAY CHEMICAL-ANALYSIS OF Y1BA2CU3O7-X FILMS BY REFLECTION-HIGH-ENERGY-ELECTRON-DIFFRACTION TOTAL-REFLECTION-ANGLE X-RAY SPECTROSCOPY
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[10] IN-SITU OBSERVATION OF BA OXIDE LAYER AT THE INTERFACE BETWEEN Y1BA2CU3O7-X FILM AND MGO SUBSTRATE
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