IN-SITU OBSERVATION OF BA OXIDE LAYER AT THE INTERFACE BETWEEN Y1BA2CU3O7-X FILM AND MGO SUBSTRATE

被引:11
作者
KAMEI, M
AOKI, Y
OGOTA, S
USUI, T
MORISHITA, T
机构
[1] Superconductivity Research Laboratory, ISTEC, Koto-ku, Tokyo 135
关键词
D O I
10.1063/1.354129
中图分类号
O59 [应用物理学];
学科分类号
摘要
The very first stage of the growth of c-axis oriented Y1Ba2Cu3O7-x films prepared by coevaporation of metallic constituents on MgO(100) was examined in situ by new surface sensitive x-ray spectroscopy. Using reflection high-energy electron diffraction and total reflection-angle x-ray spectroscopy, the Ba oxide layer of Y1Ba2Cu3O7-x was found to grow at the interface between MgO(100). It was further observed that the coverage and the flatness of this Ba-oxide layer was higher than that of Y and Cu-oxide layers.
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页码:436 / 439
页数:4
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共 13 条
  • [1] X-RAY EVANESCENT-WAVE ABSORPTION AND EMISSION
    BECKER, RS
    GOLOVCHENKO, JA
    PATEL, JR
    [J]. PHYSICAL REVIEW LETTERS, 1983, 50 (03) : 153 - 156
  • [2] ATOMICALLY LAYERED HETEROEPITAXIAL GROWTH OF SINGLE-CRYSTAL FILMS OF SUPERCONDUCTING BI2SR2CA2CU3OX
    ECKSTEIN, JN
    BOZOVIC, I
    VONDESSONNECK, KE
    SCHLOM, DG
    HARRIS, JS
    BAUMANN, SM
    [J]. APPLIED PHYSICS LETTERS, 1990, 57 (09) : 931 - 933
  • [3] DETERMINATION OF ANOMALOUS SCATTERING FACTORS IN GAAS USING X-RAY REFRACTION THROUGH A PRISM
    FONTAINE, A
    WARBURTON, WK
    LUDWIG, KF
    [J]. PHYSICAL REVIEW B, 1985, 31 (06): : 3599 - 3605
  • [4] CHEMICAL-ANALYSIS OF SURFACES BY TOTAL-REFLECTION-ANGLE X-RAY SPECTROSCOPY IN RHEED EXPERIMENTS (RHEED-TRAXS)
    HASEGAWA, S
    INO, S
    YAMAMOTO, Y
    DAIMON, H
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1985, 24 (06): : L387 - L390
  • [5] A STUDY OF ADSORPTION AND DESORPTION PROCESSES OF AG ON SI(111) SURFACE BY MEANS OF RHEED-TRAXS
    HASEGAWA, S
    DAIMON, H
    INO, S
    [J]. SURFACE SCIENCE, 1987, 186 (1-2) : 138 - 162
  • [6] INO S, 1980, JPN J APPL PHYS, V19, P1415
  • [7] KAEBLE EF, 1969, HDB XRAYS, pCH48
  • [8] INSITU X-RAY CHEMICAL-ANALYSIS OF Y1BA2CU3O7-X FILMS BY REFLECTION-HIGH-ENERGY-ELECTRON-DIFFRACTION TOTAL-REFLECTION-ANGLE X-RAY SPECTROSCOPY
    KAMEI, M
    AOKI, Y
    USUI, T
    MORISHITA, T
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1992, 31 (5A): : 1326 - 1328
  • [9] X-RAY TOTAL-EXTERNAL-REFLECTION-BRAGG DIFFRACTION - STRUCTURAL STUDY OF THE GAAS-AL INTERFACE
    MARRA, WC
    EISENBERGER, P
    CHO, AY
    [J]. JOURNAL OF APPLIED PHYSICS, 1979, 50 (11) : 6927 - 6933
  • [10] REFRACTION EFFECT OF SCATTERED X-RAY-FLUORESCENCE AT SURFACE
    SASAKI, Y
    HIROKAWA, K
    [J]. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1990, 50 (04): : 397 - 404