DETERMINATION OF ANOMALOUS SCATTERING FACTORS IN GAAS USING X-RAY REFRACTION THROUGH A PRISM

被引：21

作者：

FONTAINE, A ^{[1
]}

WARBURTON, WK ^{[1
]}

LUDWIG, KF ^{[1
]}

机构：

[1] STANFORD UNIV,DEPT APPL PHYS,STANFORD,CA 94305

来源：

PHYSICAL REVIEW B | 1985年 / 31卷 / 06期

关键词：

D O I：

10.1103/PhysRevB.31.3599

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：3599 / 3605

页数：7

共 27 条

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