HGCDTE-CR INTERFACE CHEMISTRY

被引：33

作者：

PETERMAN, DJ ^{[1
]}

FRANCIOSI, A ^{[1
]}

机构：

[1] UNIV MINNESOTA,DEPT CHEM ENGN & MAT SCI,MINNEAPOLIS,MN 55455

来源：

APPLIED PHYSICS LETTERS | 1984年 / 45卷 / 12期

关键词：

D O I：

10.1063/1.95128

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：1305 / 1306

页数：2

共 12 条

[1] CHANGES IN THE LOCAL CHEMICAL-COMPOSITION DURING THE HG1-XCDXTE-AL INTERFACE FORMATION
DANIELS, RR
MARGARITONDO, G
DAVIS, GD
BYER, NE
[J]. APPLIED PHYSICS LETTERS, 1983, 42 (01) : 50 - 52
[2] INTERACTION OF THIN-LAYERS OF AL AND GE WITH CLEAVED (HG,CD)TE SURFACES
DAVIS, GD
BYER, NE
DANIELS, RR
MARGARITONDO, G
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1983, 1 (03): : 1726 - 1729
[3] DEPOSITION OF AU OVERLAYERS ONTO CLEAVED (HG,CD)TE SURFACES
DAVIS, GD
BECK, WA
BYER, NE
DANIELS, RR
MARGARITONDO, G
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1984, 2 (02): : 546 - 550
[4] PROBING DEPTH IN PHOTOEMISSION AND AUGER-ELECTRON SPECTROSCOPY
LINDAU, I
SPICER, WE
[J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1974, 3 (05) : 409 - 413
[5] Mills K.C., 1974, THERMODYNAMIC DATA I
[6] OXIDATION OF HG1-XCDXTE STUDIED WITH SURFACE SENSITIVE TECHNIQUES
MORGEN, P
SILBERMAN, JA
LINDAU, I
SPICER, WE
WILSON, JA
[J]. JOURNAL OF ELECTRONIC MATERIALS, 1982, 11 (04) : 597 - 610
[7] METAL CDTE INTERFACES
PATTERSON, MH
WILLIAMS, RH
[J]. JOURNAL OF CRYSTAL GROWTH, 1982, 59 (1-2) : 281 - 288
[8] PETERMAN DJ, UNPUB
[9] EVIDENCE OF STRESS-MEDIATED HG MIGRATION IN HG1-XCDXTE
RACCAH, PM
LEE, U
SILBERMAN, JA
SPICER, WE
WILSON, JA
[J]. APPLIED PHYSICS LETTERS, 1983, 42 (04) : 374 - 376
[10] COMPARATIVE STUDIES OF MERCURY CADMIUM TELLURIDE SINGLE-CRYSTAL AND EPITAXIAL
RACCAH, PM
LEE, U
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1983, 1 (03): : 1587 - 1592

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