TEMPERATURE-VARIABLE CHARACTERISTICS AND NOISE IN METAL-SEMICONDUCTOR JUNCTIONS

被引：21

作者：

KOLLBERG, EL ^{[1
]}

ZIRATH, H ^{[1
]}

JELENSKI, A ^{[1
]}

机构：

[1] UNIV MASSACHUSETTS,AMHERST,MA 01003

来源：

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 1986年 / 34卷 / 09期

关键词：

D O I：

10.1109/TMTT.1986.1133471

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：913 / 922

页数：10

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