COMPARISON OF SURFACE AND BULK SCATTERING IN OPTICAL MULTILAYERS

被引：124

作者：

AMRA, C

GREZESBESSET, C

BRUEL, L

机构：

[1] Laboratoire d'Optique des Surfaces et des Couches Minces, Unite de Recherche (1120) Associee au Centre National de la Recherche Scientifique, Ecole Nationale Sup6rieure de Physique de Marseille Domaine Universitaire de St. Jer6me

来源：

APPLIED OPTICS | 1993年 / 32卷 / 28期

关键词：

THIN-FILM MULTILAYERS; SURFACE AND BULK SCATTERING; ROUGHNESS; INHOMOGENEITY; CROSS-CORRELATION COEFFICIENT;

D O I：

10.1364/AO.32.005492

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

Electromagnetic theories provide a tool to detect the origin of scattering in optical multilayers. Illumination and observation conditions that cause surface and bulk scatterings to have different behaviors are pointed out. Angular, wavelength, and polarization dependences are investigated for the location of structural irregularities at interfaces or in the bulk of a multilayer. Specific experiments can be designed.

引用

页码：5492 / 5503

页数：12

共 25 条

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