A NOVEL Z-AXIS DIFFRACTOMETER FOR X-RAY-DIFFRACTION AND FLUORESCENCE STUDIES

被引：13

作者：

BLOCH, JM

EISENBERGER, P

机构：

[1] ARGONNE NATL LAB,DIV MAT SCI,ARGONNE,IL 60439

[2] EXXON RES & ENGN CO,ANNANDALE,NJ 08801

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1988年 / 31卷 / 03期

关键词：

This work was partially supportedb y the Department of Energy; B ES-Mate~alsS ciencesu; nder contract W-31-109-ENG-38;

D O I：

10.1016/0168-583X(88)90348-5

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

24

引用

收藏

页码：468 / 474

页数：7

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