ANGLE-RESOLVED X-RAY PHOTOEMISSION SPECTROSCOPY FROM HCP CO(0001) - FORWARD FOCUSING AND ATOMIC IMAGING

被引：11

作者：

WEI, CM ^{[1
]}

ZHAO, TC ^{[1
]}

TONG, SY ^{[1
]}

机构：

[1] UNIV WISCONSIN, SURFACE STUDIES LAB, MILWAUKEE, WI 53201 USA

来源：

PHYSICAL REVIEW B | 1991年 / 43卷 / 08期

关键词：

D O I：

10.1103/PhysRevB.43.6354

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We have calculated the multiple-scattering x-ray photoemission spectroscopy angular profiles of hcp Co(0001). Layer-by-layer emission contributions are presented, and the focusing directions are identified. Angular transformation of the pattern is performed to obtain real-space images of the nearest-neighbor atoms above the emitters.

引用

页码：6354 / 6359

页数：6

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