LIGHT-SCATTERING INVESTIGATION OF NATURE OF POLISHED GLASS SURFACES

[1] RELATION BETWEEN SURFACE ROUGHNESS AND SPECULAR REFLECTANCE AT NORMAL INCIDENCE [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1961, 51 (02) : 123 - +

[2] QUANTITATIVE MEASUREMENT OF ROUGHNESS SPECTRUM OF SILVER FILMS [J]. SURFACE SCIENCE, 1974, 45 (02) : 441 - 456

[3] MESURE SIMULTANEE DES FACTEURS DE REFLEXION ET DE TRANSMISSION DES COUCHES MINCES, ET DES CHANGEMENTS DE PHASE CORRESPONDANTS [J]. JOURNAL DE PHYSIQUE, 1964, 25 (1-2): : 31 - 36

[4] BOUSQUET P, 1962, REVUE OPTIQUE, V41, P277

[5] Croce P., 1972, Nouvelle Revue d'Optique Appliquee, V3, P249, DOI 10.1088/0029-4780/3/5/302

[6] CROCE P, 1972, NOUV REV OPTIQUE APP, V3, P37

[7] THE REFLECTION OF ELECTROMAGNETIC WAVES FROM A ROUGH SURFACE [J]. PROCEEDINGS OF THE INSTITUTION OF ELECTRICAL ENGINEERS-LONDON, 1954, 101 (07): : 209 - 214

[8] EDWIN RP, 1973, J PHYS E SCI INSTRUM, V6, P55, DOI 10.1088/0022-3735/6/1/026

[9] INSTRUMENT FOR MEASURING ROUGHNESS OF SUPERSMOOTH SURFACES [J]. APPLIED OPTICS, 1974, 13 (01) : 177 - 180

[10] DETERMINATION OF SURFACE-ROUGHNESS OF THIN-FILMS USING MEASUREMENT OF ANGULAR-DEPENDENCE OF SCATTERED LIGHT FROM SURFACE PLASMA-WAVES [J]. OPTICS COMMUNICATIONS, 1974, 10 (04) : 353 - 356

[1] RELATION BETWEEN SURFACE ROUGHNESS AND SPECULAR REFLECTANCE AT NORMAL INCIDENCE [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1961, 51 (02) : 123 - +

[2] QUANTITATIVE MEASUREMENT OF ROUGHNESS SPECTRUM OF SILVER FILMS [J]. SURFACE SCIENCE, 1974, 45 (02) : 441 - 456

[3] MESURE SIMULTANEE DES FACTEURS DE REFLEXION ET DE TRANSMISSION DES COUCHES MINCES, ET DES CHANGEMENTS DE PHASE CORRESPONDANTS [J]. JOURNAL DE PHYSIQUE, 1964, 25 (1-2): : 31 - 36

[4] BOUSQUET P, 1962, REVUE OPTIQUE, V41, P277

[5] Croce P., 1972, Nouvelle Revue d'Optique Appliquee, V3, P249, DOI 10.1088/0029-4780/3/5/302

[6] CROCE P, 1972, NOUV REV OPTIQUE APP, V3, P37

[7] THE REFLECTION OF ELECTROMAGNETIC WAVES FROM A ROUGH SURFACE [J]. PROCEEDINGS OF THE INSTITUTION OF ELECTRICAL ENGINEERS-LONDON, 1954, 101 (07): : 209 - 214

[8] EDWIN RP, 1973, J PHYS E SCI INSTRUM, V6, P55, DOI 10.1088/0022-3735/6/1/026

[9] INSTRUMENT FOR MEASURING ROUGHNESS OF SUPERSMOOTH SURFACES [J]. APPLIED OPTICS, 1974, 13 (01) : 177 - 180

[10] DETERMINATION OF SURFACE-ROUGHNESS OF THIN-FILMS USING MEASUREMENT OF ANGULAR-DEPENDENCE OF SCATTERED LIGHT FROM SURFACE PLASMA-WAVES [J]. OPTICS COMMUNICATIONS, 1974, 10 (04) : 353 - 356