ANALYSIS OF THE ELECTRICAL TRANSPORT-PROPERTIES OF SILICON ON SAPPHIRE - USE OF THERMOELECTRIC-POWER MEASUREMENTS

被引:9
作者
GHIBAUDO, G
KAMARINOS, G
机构
来源
REVUE DE PHYSIQUE APPLIQUEE | 1982年 / 17卷 / 03期
关键词
D O I
10.1051/rphysap:01982001703013300
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:133 / 143
页数:11
相关论文
共 36 条
[1]  
BOREL J, 1978, ONDE ELECTR, V58, P812
[2]  
CHAIKIN P, 1975, REV SCI INSTRUM, V46, P2
[3]   GALVANOMAGNETIC EFFECTS IN INHOMOGENEOUS ANISOTROPIC SEMICONDUCTORS - APPLICATION TO CHARACTERIZATION OF SILICON FILMS ON SAPPHIRE [J].
CRISTOLOVEANU, S ;
LEE, JH ;
CHOVET, A .
REVUE DE PHYSIQUE APPLIQUEE, 1980, 15 (03) :725-732
[4]   NON UNIFORM RECOMBINATION IN THIN SILICON-ON-SAPPHIRE FILMS [J].
CRISTOLOVEANU, S ;
CHOVET, A ;
KAMARINOS, G .
SOLID-STATE ELECTRONICS, 1978, 21 (11-1) :1563-1569
[5]  
CULLEN GW, 1978, HETEROEPITAXIAL SEMI
[6]   INVESTIGATION OF CARRIER TRANSPORT IN THIN SILICON-ON-SAPPHIRE FILMS USING MIS DEEP DEPLETION HALL-EFFECT STRUCTURES [J].
ELLIOT, ABM ;
ANDERSON, JC .
SOLID-STATE ELECTRONICS, 1972, 15 (05) :531-+
[7]   DETERMINATION OF EXISTING STRESS IN SILICON FILMS ON SAPPHIRE SUBSTRATE USING RAMAN-SPECTROSCOPY [J].
ENGLERT, T ;
ABSTREITER, G ;
PONTCHARRA, J .
SOLID-STATE ELECTRONICS, 1980, 23 (01) :31-33
[8]   INVERSION-LAYERS IN SILICON ON INSULATING SUBSTRATES [J].
ENGLERT, T ;
LANDWEHR, G ;
PONTCHARRA, J ;
DORDA, G .
SURFACE SCIENCE, 1980, 98 (1-3) :427-436
[9]   SIMPLE METHOD FOR EVALUATING ELECTRONIC-PROPERTIES AT SILICON-SAPPHIRE INTERFACE [J].
GENTIL, P .
ELECTRONICS LETTERS, 1980, 16 (16) :617-618
[10]   LOW-FREQUENCY NOISE MEASUREMENTS ON SILICON-ON-SAPPHIRE (SOS) MOS-TRANSISTORS [J].
GENTIL, P ;
CHAUSSE, S .
SOLID-STATE ELECTRONICS, 1977, 20 (11) :935-940