LOW-FREQUENCY NOISE MEASUREMENTS ON SILICON-ON-SAPPHIRE (SOS) MOS-TRANSISTORS

被引：22

作者：

GENTIL, P ^{[1
]}

CHAUSSE, S ^{[1
]}

机构：

[1] INST NATL POLYTECH,ENSER,ELECTR LAB,F-38031 GRENOBLE,FRANCE

来源：

SOLID-STATE ELECTRONICS | 1977年 / 20卷 / 11期

关键词：

D O I：

10.1016/0038-1101(77)90017-X

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：935 / 940

页数：6

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