OBTAINING QUANTITATIVE INFORMATION ON AMORPHOUS LAYER THICKNESS ON CRYSTAL-SURFACE USING X-RAY-DIFFRACTION UNDER SPECULAR REFLECTION CONDITIONS

被引：26

作者：

GOLOVIN, AL

IMAMOV, RM

机构：

来源：

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1983年 / 80卷 / 01期

关键词：

D O I：

10.1002/pssa.2210800161

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

收藏

页码：K63 / K65

页数：3

相关论文

共 3 条

[1] AFANASEV AM, 1983, ACTA CRYST A, V39
[2] INVESTIGATION OF THE X-RAY-SCATTERING INTENSITY FOR THE LAUE-CASE DIFFRACTION UNDER TOTAL-EXTERNAL-REFLECTION CONDITIONS
GOLOVIN, AL
IMAMOV, RM
[J]. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1983, 77 (01): : K91 - K94
[3] X-RAY TOTAL-EXTERNAL-REFLECTION-BRAGG DIFFRACTION - STRUCTURAL STUDY OF THE GAAS-AL INTERFACE
MARRA, WC
EISENBERGER, P
CHO, AY
[J]. JOURNAL OF APPLIED PHYSICS, 1979, 50 (11) : 6927 - 6933