LATERAL PROFILING OF INTERFACE STATES ALONG THE SIDEWALLS OF CHANNEL-STOP ISOLATION

被引：13

作者：

HAWKINS, GA

机构：

来源：

SOLID-STATE ELECTRONICS | 1985年 / 28卷 / 09期

关键词：

D O I：

10.1016/0038-1101(85)90088-7

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

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页码：945 / 956

页数：12

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