COMPUTER-PROGRAM FOR PHOTOEMISSION DATA-ANALYSIS AND DISPLAY

被引：80

作者：

MAHOWALD, PH

FRIEDMAN, DJ

CAREY, GP

BERTNESS, KA

YEH, JJ

机构：

来源：

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1987年 / 5卷 / 05期

关键词：

D O I：

10.1116/1.574244

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：2982 / 2985

页数：4

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[6] APPLICATION OF MAXIMUM-ENTROPY SPECTRAL ESTIMATION TO DECONVOLUTION OF XPS DATA [J].

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