MICROWAVE NOISE CHARACTERIZATION OF GAAS-MESFETS - EVALUATION BY ON-WAFER LOW-FREQUENCY OUTPUT NOISE CURRENT MEASUREMENT

被引：48

作者：

GUPTA, MS ^{[1
]}

PITZALIS, O ^{[1
]}

ROSENBAUM, SE ^{[1
]}

GREILING, PT ^{[1
]}

机构：

[1] HUGHES RES LABS, RES LABS, MALIBU, CA 90265 USA

来源：

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 1987年 / 35卷 / 12期

关键词：

D O I：

10.1109/TMTT.1987.1133839

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：1208 / 1218

页数：11

共 21 条

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GUPTA MS, 1987, 41ST P ANN FREQ CONT

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