DOPANT REDISTRIBUTION IN SILICON-ON-SAPPHIRE FILMS DURING THERMAL ANNEALING

被引:3
作者
COWERN, NEB
YALLUP, KJ
GODFREY, DJ
机构
关键词
D O I
10.1063/1.96695
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:704 / 706
页数:3
相关论文
共 14 条
[1]   CROSS-SECTIONAL ELECTRON-MICROSCOPY OF SILICON ON SAPPHIRE [J].
ABRAHAMS, MS ;
BUIOCCHI, CJ .
APPLIED PHYSICS LETTERS, 1975, 27 (06) :325-327
[2]  
[Anonymous], COMMUNICATION
[3]  
HSU ST, 1975, RCA REV, V36, P240
[4]   INTERACTIONS IN SEQUENTIAL DIFFUSION PROCESSES IN SEMICONDUCTORS [J].
HU, SM ;
SCHMIDT, S .
JOURNAL OF APPLIED PHYSICS, 1968, 39 (09) :4272-+
[5]   RESISTIVITY OF BULK SILICON AND OF DIFFUSED LAYERS IN SILICON [J].
IRVIN, JC .
BELL SYSTEM TECHNICAL JOURNAL, 1962, 41 (02) :387-+
[6]  
LOSEE DL, 1983, J APPL PHYS, V55, P1218
[7]   IV CHARACTERISTICS OF POLYSILICON RESISTORS AT HIGH ELECTRIC-FIELD AND THE NON-UNIFORM CONDUCTION MECHANISM [J].
LU, NCC ;
LU, CY .
SOLID-STATE ELECTRONICS, 1984, 27 (8-9) :797-805
[8]  
MCPHAIL DS, UNPUB
[9]   A PROCESS SIMULATION-MODEL FOR MULTILAYER STRUCTURES INVOLVING POLYCRYSTALLINE SILICON [J].
MEI, L ;
DUTTON, RW .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1982, 29 (11) :1726-1734
[10]   DIFFUSION ALONG SMALL-ANGLE GRAIN BOUNDARIES IN SILICON [J].
QUEISSER, HJ ;
HUBNER, K ;
SHOCKLEY, W .
PHYSICAL REVIEW, 1961, 123 (04) :1245-&