ABUNDANCE OF MOLECULAR-IONS IN SECONDARY ION MASS-SPECTROMETRY

被引：15

作者：

MORGAN, AE ^{[1
]}

WERNER, HW ^{[1
]}

机构：

[1] PHILIPS RES LABS,EINDHOVEN,NETHERLANDS

来源：

APPLIED PHYSICS | 1976年 / 11卷 / 02期

关键词：

D O I：

10.1007/BF00920605

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

收藏

页码：193 / 195

页数：3

相关论文

共 11 条

[1] DEVELOPMENTS IN SECONDARY ION MASS-SPECTROSCOPY AND APPLICATIONS TO SURFACE STUDIES
BENNINGHOVEN, A
[J]. SURFACE SCIENCE, 1975, 53 (DEC) : 596 - 625
[2] CRYSTAL-STRUCTURES AND THEIR SECONDARY ION MASS-SPECTRA
BUHL, R
PREISINGER, A
[J]. SURFACE SCIENCE, 1975, 47 (01) : 344 - 357
[3] de la Berge, 1969, 5TH P INT C XRAY OPT, P311
[4] GERHARD W, 1975, Z PHYS B CON MAT, V22, P31, DOI 10.1007/BF01325457
[5] COMPUTER-SIMULATION OF SPUTTERING OF CLUSTERS
HARRISON, DE
DELAPLAIN, CB
[J]. JOURNAL OF APPLIED PHYSICS, 1976, 47 (06) : 2252 - 2259
[6] SECONDARY-ION MASS-SPECTROMETRY AND ITS USE IN DEPTH PROFILING
LIEBL, H
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1975, 12 (01): : 385 - 391
[7] QUANTITATIVE-ANALYSIS OF LOW-ALLOY STEELS BY SECONDARY ION MASS-SPECTROMETRY
MORGAN, AE
WERNER, HW
[J]. ANALYTICAL CHEMISTRY, 1976, 48 (04) : 699 - 708
[8] EFFECT OF RESIDUAL OXYGEN ON FORMATION OF MOLECULAR IONS IN SECONDARY ION MASS-SPECTROMETRY
PRAGER, M
[J]. APPLIED PHYSICS, 1975, 8 (04): : 361 - 362
[9] SURFACE OXIDATION STUDIES OF IRON USING STATIC METHOD OF SECONDARY ION MASS-SPECTROMETRY (SIMS)
STUMPE, E
BENNINGHOVEN, A
[J]. PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 1974, 21 (02): : 479 - 486
[10] Verbeek, 1973, ION SURFACE INTERACT