LASER-INDUCED PHOTOTHERMAL REFLECTANCE INVESTIGATION OF SILICON DAMAGED BY ARSENIC ION-IMPLANTATION - A TEMPERATURE STUDY

被引:21
作者
VITKIN, IA [1 ]
CHRISTOFIDES, C [1 ]
MANDELIS, A [1 ]
机构
[1] UNIV TORONTO,ONTARIO LASER & LIGHTWAVE RES CTR,TORONTO M5S 1A4,ONTARIO,CANADA
关键词
D O I
10.1063/1.101088
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:2392 / 2394
页数:3
相关论文
共 35 条
[21]   4-POINT SHEET RESISTANCE CORRECTION FACTORS FOR THIN RECTANGULAR SAMPLES [J].
PERLOFF, DS .
SOLID-STATE ELECTRONICS, 1977, 20 (08) :681-687
[22]  
PICRAUX ST, 1981, DEFECTS SEMICONDUCTO, V2, P135
[23]  
PRUSSIN S, 1985, J APPL PHYS, V57, P180, DOI 10.1063/1.334840
[24]   DETECTION OF THERMAL WAVES THROUGH OPTICAL REFLECTANCE [J].
ROSENCWAIG, A ;
OPSAL, J ;
SMITH, WL ;
WILLENBORG, DL .
APPLIED PHYSICS LETTERS, 1985, 46 (11) :1013-1015
[25]  
SKUMANICH A, 1986, APPL PHYS LETT, V47, P402
[26]   ION IMPLANT MONITORING WITH THERMAL WAVE TECHNOLOGY [J].
SMITH, WL ;
ROSENCWAIG, A ;
WILLENBORG, DL .
APPLIED PHYSICS LETTERS, 1985, 47 (06) :584-586
[27]  
SMITH WL, 1986, SOLID STATE TECHNOL, V29, P85
[28]  
Stein H. J., 1982, Laser and Electron Beam Interactions with Solids. Proceedings of the Materials Research Society Annual Meeting, P319
[29]  
Tanaka K., 1987, Photoacoustic and thermal wave phenomena in semiconductors, P441
[30]  
Touloukian Y.S., 1973, THERMAL DIFFUSIVITY