ANALYSIS OF INORGANIC MATERIALS BY BEAM TECHNIQUES - THE CHALLENGE OF HIGH TECHNOLOGY

被引：8

作者：

GRASSERBAUER, M

机构：

来源：

关键词：

D O I：

10.1016/S0003-2670(00)85646-9

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：1 / 32

页数：32

共 169 条

[61]

GRASSERBAUER M, 1985, PURE APPL CHEM, V57, P1133

[62]

GRASSERBAUER M, 1986, J REFRACT HARD METAL, V5, P30

[63]

GRASSERBAUER M, 1986, ANGEWANDTE OBERFLACH

[64]

GRASSERBAUER M, 1985, PROGR MATERIALS ANAL, V1

[65]

GRASSERBAUER M, 1985, PROGR MATERIALS ANAL, V2

[66]

GRIES WH, 1985, PROGR MATERIALS ANAL, V2, P33

[67] A WIDE AREA SCANNING SYSTEM FOR THE OXFORD PROTON MICROPROBE [J].

GRIME, GW ;

TAKACS, J ;

WATT, F .

[68]

GRONSKY B, 1984, JEOL NEWS, V22, P2

[69]

GROVENOR CRM, COMMUNICATION

[70] IMAGING XPS - A NEW TECHNIQUE - PRINCIPLES [J].

GURKER, N ;

EBEL, MF ;

EBEL, H .