SURFACE-ENHANCED RAMAN-SPECTROMETRY WITH SILVER PARTICLES ON STOCHASTIC-POST SUBSTRATES

被引：69

作者：

VO-DINH, T ^{[1
]}

MEIER, M ^{[1
]}

WOKAUN, A ^{[1
]}

机构：

[1] SWISS FED INST TECHNOL, PHYS CHEM LAB, CH-8092 ZURICH, SWITZERLAND

来源：

ANALYTICA CHIMICA ACTA | 1986年 / 181卷

关键词：

D O I：

10.1016/S0003-2670(00)85228-9

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

引用

页码：139 / 148

页数：10

共 29 条

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[19] SURFACE-ENHANCED RAMAN-SCATTERING FROM MICROLITHOGRAPHIC SILVER PARTICLE SURFACES [J].

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