SURFACE PROCESSES OCCURRING DURING BREAKDOWN OF HIGH-VOLTAGE DEVICES

被引：43

作者：

VIGOUROUX, JP ^{[1
]}

LEEDEACON, O ^{[1
]}

LEGRESSUS, C ^{[1
]}

JURET, C ^{[1
]}

BOIZIAU, C ^{[1
]}

机构：

[1] CENS,DEPT PHYS GEN,F-91190 GIF SUR YVETTE,FRANCE

来源：

IEEE TRANSACTIONS ON ELECTRICAL INSULATION | 1983年 / 18卷 / 03期

关键词：

D O I：

10.1109/TEI.1983.298615

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：287 / 291

页数：5

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