ELECTRONIC-STRUCTURE OF SIO2 - REVIEW OF RECENT SPECTROSCOPIC AND THEORETICAL ADVANCES

被引:193
作者
GRISCOM, DL [1 ]
机构
[1] USN,RES LAB,WASHINGTON,DC 20375
关键词
D O I
10.1016/0022-3093(77)90046-1
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
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页码:155 / 234
页数:80
相关论文
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