EFFECTS OF BIAS ON RADIATION-INDUCED DEFECTS IN MOS OXIDES - AN ELECTRON-SPIN-RESONANCE STUDY

被引：12

作者：

CARLOS, WE

机构：

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1984年 / 1卷 / 2-3期

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D O I：

10.1016/0168-583X(84)90096-X

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

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页码：383 / 386

页数：4

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