2-DIMENSIONAL PHOTOELECTRON DIFFRACTION PATTERNS BY DISPLAY-TYPE SPHERICAL MIRROR ANALYZER

被引：4

作者：

DAIMON, H ^{[1
]}

TEZUKA, Y ^{[1
]}

OTAKA, A ^{[1
]}

KANADA, N ^{[1
]}

LEE, SK ^{[1
]}

INO, S ^{[1
]}

NAMBA, H ^{[1
]}

KURODA, H ^{[1
]}

机构：

[1] UNIV TOKYO,FAC SCI,TOKYO 113,JAPAN

来源：

SURFACE SCIENCE | 1991年 / 242卷 / 1-3期

关键词：

D O I：

10.1016/0039-6028(91)90281-V

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Two-dimensional photoelectron diffraction patterns from Si(111), and TaC(111) surfaces have been obtained. The pattern of Si2p core emissions from Si(111) has a six-fold symmetry and that of Ta 4f emissions from TaC(111) has a three-fold symmetry. They were explained qualitatively by considering the directions of the strong scatterers. The photoelectron diffraction pattern from an ordered adsorbate has been obtained for the first time. The obtained six-fold pattern from Si(111) square-root 3 x square-root 3-Ga(3d) suggests that the Ga atoms are adsorbed above the first Si layer, and this is in good agreement with the existing model.

引用

页码：288 / 293

页数：6

共 17 条

[1]

BAIRD RJ, 1977, PHYS REV B, V15, P666, DOI 10.1103/PhysRevB.15.666

[2] PHOTOELECTRON HOLOGRAPHY [J].