EFFECT OF JUNCTION CURVATURE ON BREAKDOWN VOLTAGE IN SEMICONDUCTORS

被引:227
作者
SZE, SM
GIBBONS, G
机构
关键词
D O I
10.1016/0038-1101(66)90033-5
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:831 / &
相关论文
共 11 条
[1]   DISTRIBUTION FUNCTIONS AND IONIZATION RATES FOR HOT ELECTRONS IN SEMICONDUCTORS [J].
BARAFF, GA .
PHYSICAL REVIEW, 1962, 128 (06) :2507-&
[2]  
CHYNOWETH AG, 1960, PHYS REV, V118, P2
[3]  
GIBBONS G, 1965, IEEE T ELECTRON DEVI, VED12, P193
[4]   IONIZATION RATES OF HOLES + ELECTRONS IN SILICON [J].
LEE, CA ;
KLEIMACK, JJ ;
BATDORF, RL ;
WIEGMANN, W ;
LOGAN, RA .
PHYSICAL REVIEW, 1964, 134 (3A) :A761-+
[5]   CHARGE MULTIPLICATION IN GAP P-N JUNCTIONS [J].
LOGAN, RA ;
WHITE, HG .
JOURNAL OF APPLIED PHYSICS, 1965, 36 (12) :3945-&
[6]  
LOGAN RA, 1966 P INT C SEM PHY
[7]   AVALANCHE BREAKDOWN IN GERMANIUM [J].
MILLER, SL .
PHYSICAL REVIEW, 1955, 99 (04) :1234-1241
[8]  
MOLL JL, 1964, PHYSICS SEMICONDUCTO, pCH11
[9]   DC FIELD DISTRIBUTION IN A SWEPT INTRINSIC SEMICONDUCTOR CONFIGURATION [J].
PRIM, RC .
BELL SYSTEM TECHNICAL JOURNAL, 1953, 32 (03) :665-694
[10]  
SPEENEY DV, TO BE PUBLISHED